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doi.org/10.1038/s416...
From streaked SAED patterns, we could model the faults. TEM is indeed handy to look at defects!
doi.org/10.1038/s416...
From streaked SAED patterns, we could model the faults. TEM is indeed handy to look at defects!
doi.org/10.1016/j.jp...
Hopefully we'll have more soon about their structural part 😉
doi.org/10.1016/j.jp...
Hopefully we'll have more soon about their structural part 😉
onlinelibrary.wiley.com/doi/10.1002/...
onlinelibrary.wiley.com/doi/10.1002/...